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1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204 205 206 207 208 209 210 211 212 213 214 215 216 217 218 219 220 221 222 223 224 225 226 227 228 229 230 231 232 233 234 235 236 237 238 239 240 241 242 243 244 245 246 247 248 | // SPDX-License-Identifier: GPL-2.0 /* * Bad Block Table support for the OneNAND driver * * Copyright(c) 2005 Samsung Electronics * Kyungmin Park <kyungmin.park@samsung.com> * * Derived from nand_bbt.c * * TODO: * Split BBT core and chip specific BBT. */ #include <linux/slab.h> #include <linux/mtd/mtd.h> #include <linux/mtd/onenand.h> #include <linux/export.h> /** * check_short_pattern - [GENERIC] check if a pattern is in the buffer * @param buf the buffer to search * @param len the length of buffer to search * @param paglen the pagelength * @param td search pattern descriptor * * Check for a pattern at the given place. Used to search bad block * tables and good / bad block identifiers. Same as check_pattern, but * no optional empty check and the pattern is expected to start * at offset 0. * */ static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td) { int i; uint8_t *p = buf; /* Compare the pattern */ for (i = 0; i < td->len; i++) { if (p[i] != td->pattern[i]) return -1; } return 0; } /** * create_bbt - [GENERIC] Create a bad block table by scanning the device * @param mtd MTD device structure * @param buf temporary buffer * @param bd descriptor for the good/bad block search pattern * @param chip create the table for a specific chip, -1 read all chips. * Applies only if NAND_BBT_PERCHIP option is set * * Create a bad block table by scanning the device * for the given good/bad block identify pattern */ static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip) { struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int i, j, numblocks, len, scanlen; int startblock; loff_t from; size_t readlen, ooblen; struct mtd_oob_ops ops; int rgn; printk(KERN_INFO "Scanning device for bad blocks\n"); len = 2; /* We need only read few bytes from the OOB area */ scanlen = ooblen = 0; readlen = bd->len; /* chip == -1 case only */ /* Note that numblocks is 2 * (real numblocks) here; * see i += 2 below as it makses shifting and masking less painful */ numblocks = this->chipsize >> (bbm->bbt_erase_shift - 1); startblock = 0; from = 0; ops.mode = MTD_OPS_PLACE_OOB; ops.ooblen = readlen; ops.oobbuf = buf; ops.len = ops.ooboffs = ops.retlen = ops.oobretlen = 0; for (i = startblock; i < numblocks; ) { int ret; for (j = 0; j < len; j++) { /* No need to read pages fully, * just read required OOB bytes */ ret = onenand_bbt_read_oob(mtd, from + j * this->writesize + bd->offs, &ops); /* If it is a initial bad block, just ignore it */ if (ret == ONENAND_BBT_READ_FATAL_ERROR) return -EIO; if (ret || check_short_pattern(&buf[j * scanlen], scanlen, this->writesize, bd)) { bbm->bbt[i >> 3] |= 0x03 << (i & 0x6); printk(KERN_INFO "OneNAND eraseblock %d is an " "initial bad block\n", i >> 1); mtd->ecc_stats.badblocks++; break; } } i += 2; if (FLEXONENAND(this)) { rgn = flexonenand_region(mtd, from); from += mtd->eraseregions[rgn].erasesize; } else from += (1 << bbm->bbt_erase_shift); } return 0; } /** * onenand_memory_bbt - [GENERIC] create a memory based bad block table * @param mtd MTD device structure * @param bd descriptor for the good/bad block search pattern * * The function creates a memory based bbt by scanning the device * for manufacturer / software marked good / bad blocks */ static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd) { struct onenand_chip *this = mtd->priv; return create_bbt(mtd, this->page_buf, bd, -1); } /** * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad * @param mtd MTD device structure * @param offs offset in the device * @param allowbbt allow access to bad block table region */ static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt) { struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int block; uint8_t res; /* Get block number * 2 */ block = (int) (onenand_block(this, offs) << 1); res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03; pr_debug("onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n", (unsigned int) offs, block >> 1, res); switch ((int) res) { case 0x00: return 0; case 0x01: return 1; case 0x02: return allowbbt ? 0 : 1; } return 1; } /** * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s) * @param mtd MTD device structure * @param bd descriptor for the good/bad block search pattern * * The function checks, if a bad block table(s) is/are already * available. If not it scans the device for manufacturer * marked good / bad blocks and writes the bad block table(s) to * the selected place. * * The bad block table memory is allocated here. It is freed * by the onenand_release function. * */ static int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd) { struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int len, ret = 0; len = this->chipsize >> (this->erase_shift + 2); /* Allocate memory (2bit per block) and clear the memory bad block table */ bbm->bbt = kzalloc(len, GFP_KERNEL); if (!bbm->bbt) return -ENOMEM; /* Set the bad block position */ bbm->badblockpos = ONENAND_BADBLOCK_POS; /* Set erase shift */ bbm->bbt_erase_shift = this->erase_shift; if (!bbm->isbad_bbt) bbm->isbad_bbt = onenand_isbad_bbt; /* Scan the device to build a memory based bad block table */ if ((ret = onenand_memory_bbt(mtd, bd))) { printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n"); kfree(bbm->bbt); bbm->bbt = NULL; } return ret; } /* * Define some generic bad / good block scan pattern which are used * while scanning a device for factory marked good / bad blocks. */ static uint8_t scan_ff_pattern[] = { 0xff, 0xff }; static struct nand_bbt_descr largepage_memorybased = { .options = 0, .offs = 0, .len = 2, .pattern = scan_ff_pattern, }; /** * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device * @param mtd MTD device structure * * This function selects the default bad block table * support for the device and calls the onenand_scan_bbt function */ int onenand_default_bbt(struct mtd_info *mtd) { struct onenand_chip *this = mtd->priv; struct bbm_info *bbm; this->bbm = kzalloc(sizeof(struct bbm_info), GFP_KERNEL); if (!this->bbm) return -ENOMEM; bbm = this->bbm; /* 1KB page has same configuration as 2KB page */ if (!bbm->badblock_pattern) bbm->badblock_pattern = &largepage_memorybased; return onenand_scan_bbt(mtd, bbm->badblock_pattern); } |